A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement

Yuibi Gomi, Akira Sato, Waleed Madany +4

We developed a 55 nm CMOS SRAM chip that scans all data every 125 ns and outputs timestamped soft error data via an SPI interface through a FIFO. The proposed system, consisting of…