Akira Sato

most citedA 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement

2 citations · 2 across the 1 of their papers we have counts for

collaborators

2 papers

physics.ins-det2025★ 2 cited

A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement

Yuibi Gomi, Akira Sato, Waleed Madany +4

We developed a 55 nm CMOS SRAM chip that scans all data every 125 ns and outputs timestamped soft error data via an SPI interface through a FIFO. The proposed system, consisting of…

nucl-ex2017

Muon capture reaction on $^{100} M o$ to study nuclear responses for double beta decays and astro-neutrinos

I. H. Hashim, H. Ejiri, T. Shima +5

The negative-muon capture reaction (MCR) on the enriched $^{100} M o$ isotope was studied for the first time to investigate neutrino nuclear response for neutrino-less double beta de…

A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement

Muon capture reaction on 100Mo to study nuclear responses for double beta decays and astro-neutrinos

Muon capture reaction on $^{100} M o$ to study nuclear responses for double beta decays and astro-neutrinos