most citedA 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement

2 citations · 2 across the 1 of their papers we have counts for

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physics.ins-det2025★ 2 cited

A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement

Yuibi Gomi, Akira Sato, Waleed Madany +4

We developed a 55 nm CMOS SRAM chip that scans all data every 125 ns and outputs timestamped soft error data via an SPI interface through a FIFO. The proposed system, consisting of…