most citedQuantitative approaches for multi-scale structural analysis with atomic resolution electron microscopy

3 citations · 3 across the 5 of their papers we have counts for

collaborators

6 papers

cond-mat.mtrl-sci2026

Face-to-face anneal temperature controls lattice parameter in Ta(C,N) virtual substrates for AlGaN power electronics

Noah Zahn, Julia L. Martin, Michelle A. Smeaton +3

Tantalum carbide (TaC) thin film ''virtual'' substrates are a highly desirable material for vertical power electronics devices due to latti…

cond-mat.mtrl-sci2026

Revealing epitaxial relationships at GaO interfaces with p-type oxides

Anna Sacchi, Krishna Acharya, Michelle A. Smeaton +5

p-type oxide contact layers such as CrO and NiO are attracting increasing interest in pn-heterojunctions with n-type monoclinic -GaO for high-power electronic de…

cond-mat.mtrl-sci2026

Low resistance NiO/β-Ga_{2}O_{3} heterojunction diodes grown via molecular beam epitaxy

Dagny Sacksteder, Anna Sacchi, Renae Gannon +4

NiO is one of the most important p-type oxide contact materials used in many semiconductor technologies. However, current NiO growth methods can induce interfacial damage that dimi…

cond-mat.mtrl-sci2026

High-Temperature Hydrogen Sensors Based on Gallium Oxide Heterojunction Diodes

William A. Callahan, Kingsley Egbo, Anna Sacchi +5

Long-term, high temperature operation of Ga2O3 devices is a crucial hurdle that must be overcome before widespread adoption of the technology can be achieved, but is largely absent…

cond-mat.mtrl-sci2026

Revealing the Atomic Structure of NiO/GaO Interfaces

Michelle A. Smeaton, Krishna Acharya, Anna Sacchi +5

NiO/GaO heterojunctions have garnered significant attention for use in power electronics due to the ultrawide bandgap and wafer-scale availability of GaO an…

cond-mat.mtrl-sci2025★ 3 cited

Quantitative approaches for multi-scale structural analysis with atomic resolution electron microscopy

Noah Schnitzer, Lopa Bhatt, Ismail El Baggari +4

Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as…