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cs.CV2026
DCM-SAM: Defect-Conditioned Mixture of LoRA Experts for NPU-Deployed AM Defect Segmentation
Md Mushfiqur Rahaman, Md Mahedi Hasan, Imtiaz Ahmed +1
Metal additive manufacturing parts are inspected by X-ray computed tomography, where labelled data is scarce, the pores and inclusions that matter span a few pixels, and inspection…
cs.CV2026
XCT-SAM: Sequential Parameter-Efficient Domain Adaptation of SAM for Industrial XCT Defect Segmentation
Md Mahedi Hasan, Md Mushfiqur Rahaman, Alan Pachkovskiy +3
Defect segmentation in additive manufacturing (AM) X-ray computed tomography (XCT) images remains challenging due to severe class imbalance and large distribution shifts across sca…