5 citations · 6 across the 6 of their papers we have counts for
3 papers · 1 filter
Columnar grain boundaries are the weakest link in hard coatings: Insights from micro-cantilever testing with bridge notches
Yinxia Zhang, Matthias Bartosik, Steffen Brinckmann +3
The effect of columnar grain boundaries on the fracture toughness was investigated using micro-cantilever fracture testing with a bridge notch, and a unique hard coating consisting…
Redundant Cross-Correlation for Drift Correction in SEM Nanoparticle Imaging
Iago Bischoff Montenegro, Konrad Prikoszovich, Subin Lee +3
Scanning Electron Microscopy (SEM) is a widely used tool for nanoparticle characterization, but long-term directional drift can compromise image quality. We present a novel algorit…
Data-efficient 4D-STEM in SEM: Beyond 2D Materials to Metallic Materials
Ujjval Bansal, Amit Sharma, Barbara Putz +2
Four-dimensional scanning transmission electron microscopy (4D-STEM) is a powerful tool that allows for the simultaneous acquisition of spatial and diffraction information, driven…