collaborators

7 papers

physics.optics2026

Broadband Chromatic Dispersion of Thermo-refractive Coefficients and its Impact in Silicon Nitride Nonlinear Photonics

Shao-Chien Ou, Gregory Moille, Kartik Srinivasan

The thermo-refractive effect is a cornerstone of frequency and phase tuning in photonic integrated circuits. In particular, it enables control of phase-matching for integrated nonl…

physics.optics2026

Universal Bright-Bright Integrated Soliton Molecule via Parametric Binding

Pradyoth Shandilya, Shao-Chien Ou, Alioune Niang +4

Dissipative Kerr solitons (DKSs) have emerged as the preferred solution for on-chip integrated optical frequency comb (OFC) generation in metrology. A multi-pumped DKS enables eith…

physics.optics2026

Self-aligned optical microcomb emerging between octave separated lasers

Grégory Moille, Pradyoth Shandilya, Jordan Stone +11

Optical frequency combs (OFCs) are frequency rulers essential for precision metrology, next generation navigation, and testing of fundamental physics. Despite intense efforts, chip…

physics.optics2026

Microring Resonator Dispersion Metrology with Neural Networks

Ergun Simsek, Shao-Chien Ou, Gregory Moille +1

Precise knowledge of resonator dispersion, from both geometric and material contributions, is essential for reliable high-performance nonlinear integrated photonics devices, such a…

physics.optics2025

300 mm Wafer-Scale SiN Platform for Broadband Soliton Microcombs Compatible with Alkali Atomic References

Shao-Chien Ou, Alin Antohe, Lewis G. Carpenter +2

Chip-integrated optical frequency combs (OFCs) based on Kerr nonlinear resonators are of great significance given their scalability and wide range of applications. Broadband on-chi…

physics.optics2025

Multi-timescale frequency-phase matching for high-yield nonlinear photonics

Mahmoud Jalali Mehrabad, Lida Xu, Gregory Moille +9

Integrated nonlinear photonic technologies, even with state-of-the-art fabrication with only a few nanometer geometry variations, face significant challenges in achieving wafer-sca…