2 papers
cond-mat.mtrl-sci2026
Physics-aware global Rietveld refinement for high-energy X-ray diffraction microscopy with application to reconstructing intragranular orientation and strain fields
Carter K. Cocke, Eitan Camacho, Sara F. Gorske +2
High-energy X-ray diffraction microscopy (HEDM) has emerged as a critical technique for studying the microstructure and, increasingly, strain fields in solids. However, current alg…
cond-mat.mtrl-sci2025
On recovering intragranular strain fields from grain-averaged strains obtained by high-energy X-ray diffraction microscopy
C. K. Cocke, A. Akerson, S. F. Gorske +2
We address an unusual problem in the theory of elasticity motivated by the problem of reconstructing the strain field from partial information obtained using X-ray diffraction. Ref…