15 citations · 33 across the 10 of their papers we have counts for
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cs.CV2023★ 4 cited
Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review
Thibault Lechien, Enrique Dehaerne, Bappaditya Dey +4
A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency…
astro-ph.GA2023★ 4 cited
Dark Matter reconstruction from stellar orbits in the Galactic Centre
Thibault Lechien, Gernot Heißel, Jai Grover +1
Context. Current constraints on distributed matter in the innermost Galactic Centre (such as a cluster of faint stars and stellar remnants, Dark Matter or a combination thereof) ba…