Strain accommodation through facet matching in La${}_{\text{1.85}}$Sr${}_{\text{0.15}}$CuO${}_{\text{4}}$/Nd${}_{\text{1.85}}$Ce${}_{\text{0.15}}$CuO${}_{\text{4}}$ ramp-edge junctions

M. Hoek, F. Coneri, X. Renshaw Wang +4

Scanning nano-focused X-ray diffraction (nXRD) and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) are used to investigate the crystal structur…