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cond-mat.mtrl-sci2024
AFM-based Functional Tomography-To Mill or not to Mill, that is the Question!
Niyorjyoti Sharma, Kristina M. Holsgrove, James Dalzell +8
The electrical response of ferroelectric domain walls is often influenced by their geometry underneath the sample surface. Tomographic imaging in these material systems has therefo…
cond-mat.mtrl-sci2024
Spatially Resolved High Voltage Kelvin Probe Force Microcopy: A Novel Avenue for Examining Electrical Phenomena at Nanoscale
Conor J. McCluskey, Niyorjyoti Sharma, Jesi R. Maguire +9
Kelvin probe microscopy (KPFM) is a well-established scanning probe technique, used to measure surface potential accurately; it has found extensive use in the study of a range of m…