most citedCharacterization of WSe films using reflection Kikuchi diffraction in the scanning electron microscope and multivariate statistical analyses

2 citations · 2 across the 1 of their papers we have counts for

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cond-mat.mtrl-sci2025★ 2 cited

Characterization of WSe films using reflection Kikuchi diffraction in the scanning electron microscope and multivariate statistical analyses

Tianbi Zhang, Jakub Holzer, Tomáš Vystavěl +4

The study of thin films and 2D materials, including transition metal dichalcogenides such as WSe offers opportunities to leverage their properties in advanced sensors, quantum…