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most citedAn Empirical Fault Vulnerability Exploration of ReRAM-based Process-in-Memory CNN Accelerators

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cs.AR2025

OptGM: An Optimized Gate Merging Method to Mitigate NBTI in Digital Circuits

Amir M. Hajisadeghi, Maryam Ghane, Hamid R. Zarandi

This paper presents OptGM, an optimized gate merging method designed to mitigate negative bias temperature instability (NBTI) in digital circuits. First, the proposed approach effe…