1 citations · 1 across the 2 of their papers we have counts for
2 papers
cs.CV2025★ 1 cited
Semiconductor SEM Image Defect Classification Using Supervised and Semi-Supervised Learning with Vision Transformers
Chien-Fu, Huang, Katherine Sieg +4
Controlling defects in semiconductor processes is important for maintaining yield, improving production cost, and preventing time-dependent critical component failures. Electron be…
cs.CV2023
Image Recognition of Oil Leakage Area Based on Logical Semantic Discrimination
Weiying Lin, Che Liu, Xin Zhang +3
Implementing precise detection of oil leaks in peak load equipment through image analysis can significantly enhance inspection quality and ensure the system's safety and reliabilit…