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math.ST2025
Robust statistical inference for accelerated life-tests with one-shot devices under log-logistic distributions
María González-Calderón, María Jaenada, Leandro Pardo
A one-shot device is a unit that operates only once, after which it is either destroyed or needs to be rebuilt. For this type of device, the operational status can only be assessed…
math.ST2024
Robust inference for an interval-monitored step-stress experiment under proportional hazards
Narayanaswamy Balakrishnan, María Jaenada, Leandro Pardo
Accelerated life tests (ALTs) play a crucial role in reliability analyses, providing lifetime estimates of highly reliable products. Among ALTs, step-stress design increases the st…
math.ST2023
Robust inference for an interval-monitored step-stress experiment with competing risks for failure
Narayanaswamy Balakrishnan, Maria Jaenada, Leandro Pardo
Accelerated life-tests (ALTs) are used for inferring lifetime characteristics of highly reliable products. In particular, step-stress ALTs increase the stress level at which units…