1 citations · 1 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2025★ 1 cited
Auger parameter analysis for TiN and AlN thin films via combined in-situ XPS and HAXPES
O. V. Pshyk, J. Patidar, C. Cancellieri +1
Auger parameter analysis provides in-depth information about the electronic and chemical bonding properties of TiN and AlN thin films, which are relevant across a wide range of tec…
cond-mat.mtrl-sci2024
Computationally-guided discovery and synthesis of the amorphous nitride Y2WN4
O. V. Pshyk, S. Zhuk, J. Patidar +6
Amorphous materials offer unique functional characteristics, which are often not observed in their crystalline counterparts. This makes them invaluable for many technological appli…