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20222025
most citedProbing electron beam induced transformations on a single defect level via automated scanning transmission electron microscopy

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cond-mat.dis-nn2022★ 1 cited

Probing electron beam induced transformations on a single defect level via automated scanning transmission electron microscopy

Kevin M. Roccapriore, Matthew G. Boebinger, Ondrej Dyck +4

The robust approach for real-time analysis of the scanning transmission electron microscopy (STEM) data streams, based on the ensemble learning and iterative training (ELIT) of dee…