3 papers
physics.app-ph2026
Pushing the Dose Limit of Atomic-Resolution Imaging: A 4D-STEM case study of NaCl
Tamazouzt Chennit, Arno Annys, Songge Li +3
Beam-induced damage fundamentally limits the characterization of beam-sensitive materials by scanning transmission electron microscopy (STEM), since structural information must be…
cond-mat.mtrl-sci2025
Investigating the convergence properties of iterative ptychography for atomic-resolution low-dose imaging
Tamazouzt Chennit, Songge Li, Hoelen L. Lalandec Robert +6
This study investigates the convergence properties of a collection of iterative electron ptychography methods, under low electron doses ( 10 ) and gives particular…
physics.app-ph2025
Improving the low-dose performance of aberration correction in single sideband ptychography
Songge Li, Nicolas Gauquelin, Hoelen L. Lalandec Robert +5
The single sideband (SSB) framework of analytical electron ptychography can account for the presence of residual geometrical aberrations induced by the probe-forming lens. However,…