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physics.app-ph2026
Pushing the Dose Limit of Atomic-Resolution Imaging: A 4D-STEM case study of NaCl
Tamazouzt Chennit, Arno Annys, Songge Li +3
Beam-induced damage fundamentally limits the characterization of beam-sensitive materials by scanning transmission electron microscopy (STEM), since structural information must be…
cond-mat.mtrl-sci2026
Designing dislocation-driven polar vortex networks in twisted perovskites
William Sandholt, Nicolas Gauquelin, John Mangeri +21
Twisting two atomic layers produces a geometric moire pattern, but bonding-induced interfacial reconstruction fundamentally transforms this into an ordered dislocation network - a…