most citedMic-hackathon 2024: Hackathon on Machine Learning for Electron and Scanning Probe Microscopy

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eess.SP2026

Inference-Sufficient Representations for High-Throughput Measurement: Lessons from Lossless Compression Benchmarks in 4D-STEM

Ondrej Dyck, Andrew R. Lupini, Albina Borisevich +3

Four-dimensional scanning transmission electron microscopy (4D-STEM) generates multi-gigabyte datasets, creating a growing mismatch between acquisition rates and practical storage,…