2 papers
cs.CV2026
A benchmark dataset and baseline methods for four-dimensional STEM diffraction patterns
Yuyan Guan, Haoran Zhang, Zian Mao +7
Four-dimensional scanning transmission electron microscopy (4D-STEM) records a two-dimensional diffraction pattern at each electron-probe position, yielding spatially resolved reci…
cs.CV2025
4D-MISR: A unified model for low-dose super-resolution imaging via feature fusion
Zifei Wang, Zian Mao, Xiaoya He +7
While electron microscopy offers crucial atomic-resolution insights into structure-property relationships, radiation damage severely limits its use on beam-sensitive materials like…