most citedTime performance of Analog Pixel Test Structures with in-chip operational amplifier implemented in 65 nm CMOS imaging process

5 citations · 12 across the 3 of their papers we have counts for

collaborators

4 papers

physics.ins-det2025

Influence of Radiation and AC Coupling on Time Performance of Analog Pixels Test Structures in 65 nm CMOS technology

Gianluca Aglieri Rinella, Luca Aglietta, Matias Antonelli +44

Monolithic Active Pixel Sensors (MAPS) in advanced CMOS imaging technologies are key to next-generation tracking systems for high-energy physics, where radiation hardness and preci…

physics.ins-det2025★ 3 cited

Yield, noise and timing studies of ALICE ITS3 stitched sensor test structures: the MOST

Jory Sonneveld, René Barthel, Szymon Bugiel +18

In the LHC long shutdown 3, the ALICE experiment upgrades the inner layers of its Inner Tracker System with three layers of wafer-scale stitched sensors bent around the beam pipe.…

physics.ins-det2025★ 4 cited

Exploring unique design features of the Monolithic Stitched Sensor with Timing (MOST): yield, powering, timing, and sensor reverse bias

Mariia Selina, R. Barthel, S. Bugiel +18

Monolithic stitched CMOS sensors are explored for the upgrade of Inner Tracking System of the ALICE experiment (ITS3) and the R&D of the CERN Experimental Physics Department. To le…

physics.ins-det2024★ 5 cited

Time performance of Analog Pixel Test Structures with in-chip operational amplifier implemented in 65 nm CMOS imaging process

Gianluca Aglieri Rinella, Luca Aglietta, Matias Antonelli +43

In the context of the CERN EP R&D on monolithic sensors and the ALICE ITS3 upgrade, the Tower Partners Semiconductor Co (TPSCo) 65 nm process has been qualified for use in high ene…