44 citations · 44 across the 3 of their papers we have counts for
4 papers
Nanometer-scale operando electric field mapping in oxide junctions by correlative STEM-EBIC and 4D-STEM
Yining Xie, Eoin Moynihan, Xingyao Li +5
Understanding local electric fields at oxide interfaces is essential for linking interfacial electrostatics to device functionality, yet conventional electrical measurements infer…
Predictive drift compensation of multi-frame STEM via live scan modification
Matthew Mosse, Jonathan J. P. Peters, Eoin Moynihan +4
Scanning transmission electron microscopy (STEM) is widely used tool for materials characterisation. However, being a scanned technique, STEM is susceptible to sample, stage or bea…
Template masks for 4D-STEM
Yining Xie, Eoin Moynihan, Marin Alexe +3
We present a new analysis method for atomic resolution four-dimensional scanning transmission electron microscopy (4D-STEM, in which a diffraction pattern is collected at each poin…
Flexoelectric control of a ferromagnetic metal
Wei Peng, Se Young Park, Chang Jae Roh +16
Electric fields have played a key role in discovering and controlling exotic electronic states of condensed matter. However, electric fields usually do not work in metals as free c…