2 papers
cond-mat.str-el2025
Electronic localization on the structural inhomogeneities formed due to Bi and Te deficiency in the MBE grown films of AFM topological insulator MnBi2Te4: Evidence from spectroscopic ellipsometry and infrared studies
N. N. Kovaleva, D. Chvostova, T. N. Fursova +7
The intrinsic substitutional and antisite defects cause unintentional doping and shift of the E_F position above the conduction band minimum in the AFM topological insulator (TI) M…
cond-mat.mtrl-sci2023
Amorphous VO films with high temperature coefficient of the resistivity grown by reactive e-beam evaporation of V metal
E. V. Tarkaeva, V. A. Ievleva, A. I. Duleba +2
Amorphous VO films without a hysteretic phase transition are stable with respect to thermal cycling and highly demanded as sensitive elements of the resistive thermometers and…