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cond-mat.mtrl-sci2025
Operando Electron Microscopy of Nanoscale Electronic Devices on Non-Conductive Substrates
Menglin Zhu, Michael Xu, Zishen Tian +7
Achieving operating conditions comparable to ``bulk'' electronic devices, such as thin film capacitors, during \textit{operando} electron microscopy remains challenging, particular…
cond-mat.mtrl-sci2025
Optimizing Atomic Number Contrast in Multislice Electron Ptychography
Bridget R. Denzer, Colin Gilgenbach, James M. LeBeau
Here we explore the atomic number () dependence of multislice electron ptychography and approaches to optimize Z sensitivity. Specifically, we show that ptychography's -depen…