2 papers
cs.AR2026
ITHICA: Intra-Thread Instruction Checking Approach for Defect-Induced Silent Data Corruptions
Ioanna Vavelidou, Subho S. Banerjee, Eric X. Liu +3
Hyperscalers are reporting silent data corruptions (SDCs), presumed to be caused by silicon manufacturing defects, as a threat to datacenter reliability. To support datacenter test…
cs.AR2025
Silent Data Corruption by 10x Test Escapes Threatens Reliable Computing
Subhasish Mitra, Subho Banerjee, Martin Dixon +5
Too many defective compute chips are escaping existing manufacturing tests -- at least an order of magnitude more than industrial targets across all compute chip types in data cent…