4 papers
Diffuse to Detect: Generative Diffusion Models for Unsupervised IC Anomaly Detection
Yuxuan Yin, Chen He, Todd Jacobs +4
Latent defect screening is challenged by extremely low failure rates, high-dimensional test data, and absence of labeled anomalies. We propose the first unsupervised anomaly detect…
Transfer Learning for Minimum Operating Voltage Prediction in Advanced Technology Nodes: Leveraging Legacy Data and Silicon Odometer Sensing
Yuxuan Yin, Rebecca Chen, Boxun Xu +2
Accurate prediction of chip performance is critical for ensuring energy efficiency and reliability in semiconductor manufacturing. However, developing minimum operating voltage ($V…
Data-Efficient Prediction of Minimum Operating Voltage via Inter- and Intra-Wafer Variation Alignment
Yuxuan Yin, Rebecca Chen, Chen He +1
Predicting the minimum operating voltage () of chips stands as a crucial technique in enhancing the speed and reliability of manufacturing testing flow. However, existing…
Reliable Interval Prediction of Minimum Operating Voltage Based on On-chip Monitors via Conformalized Quantile Regression
Yuxuan Yin, Xiaoxiao Wang, Rebecca Chen +2
Predicting the minimum operating voltage () of chips is one of the important techniques for improving the manufacturing testing flow, as well as ensuring the long-term rel…