7 citations · 11 across the 3 of their papers we have counts for
3 papers
Targeted Wearout Attacks in Microprocessor Cores
Joshua Mashburn, Johann Knechtel, Florian Klemme +3
Negative-Bias Temperature Instability is a dominant aging mechanism in nanoscale CMOS circuits such as microprocessors. With this aging mechanism, the rate of device aging is depen…
Variability-Aware Approximate Circuit Synthesis via Genetic Optimization
Konstantinos Balaskas, Florian Klemme, Georgios Zervakis +3
One of the major barriers that CMOS devices face at nanometer scale is increasing parameter variation due to manufacturing imperfections. Process variations severely inhibit the re…
GNN4REL: Graph Neural Networks for Predicting Circuit Reliability Degradation
Lilas Alrahis, Johann Knechtel, Florian Klemme +2
Process variations and device aging impose profound challenges for circuit designers. Without a precise understanding of the impact of variations on the delay of circuit paths, gua…