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cs.CV2026
A benchmark dataset and baseline methods for four-dimensional STEM diffraction patterns
Yuyan Guan, Haoran Zhang, Zian Mao +7
Four-dimensional scanning transmission electron microscopy (4D-STEM) records a two-dimensional diffraction pattern at each electron-probe position, yielding spatially resolved reci…
cs.CV2025
4D-PreNet: A Unified Preprocessing Framework for 4D-STEM Data Analysis
Mingyu Liu, Zian Mao, Zhu Liu +8
Automated experimentation with real time data analysis in scanning transmission electron microscopy (STEM) often require end-to-end framework. The four-dimensional scanning transmi…
cs.CV2025
4D-MISR: A unified model for low-dose super-resolution imaging via feature fusion
Zifei Wang, Zian Mao, Xiaoya He +7
While electron microscopy offers crucial atomic-resolution insights into structure-property relationships, radiation damage severely limits its use on beam-sensitive materials like…