4 citations · 6 across the 3 of their papers we have counts for
4 papers
Predictive drift compensation of multi-frame STEM via live scan modification
Matthew Mosse, Jonathan J. P. Peters, Eoin Moynihan +4
Scanning transmission electron microscopy (STEM) is widely used tool for materials characterisation. However, being a scanned technique, STEM is susceptible to sample, stage or bea…
Beyond Contrast Transfer: Spectral SNR as a Dose-Aware Metric for STEM Phase Retrieval
Georgios Varnavides, Julie Marie Bekkevold, Stephanie M Ribet +3
The contrast transfer function (CTF) is widely used to evaluate phase retrieval methods in scanning transmission electron microscopy (STEM), including center-of-mass imaging, paral…
Relaxing Direct Ptychography Sampling Requirements via Parallax Imaging Insights
Georgios Varnavides, Julie Marie Bekkevold, Stephanie M Ribet +3
Direct ptychography enables the retrieval of information encoded in the phase of an electron wave passing through a thin sample by deconvolving the interference effects of a conver…
Ultra-fast Digital DPC Yielding High Spatio-Temporal Resolution for Low-Dose Phase Characterisation
Julie Marie Bekkevold, Jonathan J. P. Peters, Ryo Ishikawa +2
In the scanning transmission electron microscope, both phase imaging of beam-sensitive materials and characterisation of a material's functional properties using in-situ experiment…