11 citations · 30 across the 8 of their papers we have counts for
8 papers
Dynamical Simulation of On-axis Transmission Kikuchi and Spot Diffraction Patterns, Based on Accurate Diffraction Geometry Calibration
Tianbi Zhang, Raynald Gauvin, Aimo Winkelmann +1
Transmission Kikuchi diffraction in the scanning electron microscope has gained popularity as a materials characterization technique for its high throughput and nanometer-level spa…
Angular Resolution Enhancement of Electron Backscatter Diffraction Patterns
Ben Britton, Tianbi Zhang
We present a simple 'shift-and-add' based improvement in the angular resolution of single electron backscatter diffraction (EBSD) patterns. Sub-pixel image registration is used to…
AstroECP: towards more practical Electron Channeling Contrast Imaging
M. Haroon Qaiser, Lukas Berners, Robin J. Scales +5
Electron channeling contrast imaging (ECCI) is a scanning electron microscopy (SEM) based technique that enables bulk-sample characterization of crystallographic defects (e.g. disl…
Characterization of WSe films using reflection Kikuchi diffraction in the scanning electron microscope and multivariate statistical analyses
Tianbi Zhang, Jakub Holzer, Tomáš Vystavěl +4
The study of thin films and 2D materials, including transition metal dichalcogenides such as WSe offers opportunities to leverage their properties in advanced sensors, quantum…
Practical considerations for crystallographic and microstructure mapping with direct electron detector-based electron backscatter diffraction
Tianbi Zhang, Ruth Birch, Graeme Francolini +2
Compact direct electron detectors are becoming increasingly popular in electron microscopy applications including electron backscatter diffraction, as they offer an opportunity for…
Comparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope
Tianbi Zhang, Lukas Berners, Jakub Holzer +1
Recent advances in scanning electron microscope (SEM) based Kikuchi diffraction have demonstrated the important potential for reflection and transmission methods, like transmission…
A simple, static and stage mounted direct electron detector based electron backscatter diffraction system
Tianbi Zhang, T. Ben Britton
To engineer the next generation of advanced materials we must understand their microstructure, and this requires microstructural characterization. This can be achieved through the…
Multi-exposure diffraction pattern fusion applied to enable wider-angle transmission Kikuchi diffraction with direct electron detectors
Tianbi Zhang, T. Ben Britton
Diffraction pattern analysis can be used to reveal the crystalline structure of materials, and this information is used to nano- and micro-structure of advanced engineering materia…