activity
20232026
most citedComparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope

11 citations · 18 across the 6 of their papers we have counts for

collaborators

8 papers

cond-mat.mtrl-sci2026

Dynamical Simulation of On-axis Transmission Kikuchi and Spot Diffraction Patterns, Based on Accurate Diffraction Geometry Calibration

Tianbi Zhang, Raynald Gauvin, Aimo Winkelmann +1

Transmission Kikuchi diffraction in the scanning electron microscope has gained popularity as a materials characterization technique for its high throughput and nanometer-level spa…

physics.ins-det2025

Angular Resolution Enhancement of Electron Backscatter Diffraction Patterns

Ben Britton, Tianbi Zhang

We present a simple 'shift-and-add' based improvement in the angular resolution of single electron backscatter diffraction (EBSD) patterns. Sub-pixel image registration is used to…

cond-mat.mtrl-sci2025

AstroECP: towards more practical Electron Channeling Contrast Imaging

M. Haroon Qaiser, Lukas Berners, Robin J. Scales +5

Electron channeling contrast imaging (ECCI) is a scanning electron microscopy (SEM) based technique that enables bulk-sample characterization of crystallographic defects (e.g. disl…

cond-mat.mtrl-sci20252 cited

Characterization of WSe films using reflection Kikuchi diffraction in the scanning electron microscope and multivariate statistical analyses

Tianbi Zhang, Jakub Holzer, Tomáš Vystavěl +4

The study of thin films and 2D materials, including transition metal dichalcogenides such as WSe offers opportunities to leverage their properties in advanced sensors, quantum…

cond-mat.mtrl-sci20255 cited

Practical considerations for crystallographic and microstructure mapping with direct electron detector-based electron backscatter diffraction

Tianbi Zhang, Ruth Birch, Graeme Francolini +2

Compact direct electron detectors are becoming increasingly popular in electron microscopy applications including electron backscatter diffraction, as they offer an opportunity for…

cond-mat.mtrl-sci202411 cited

Comparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope

Tianbi Zhang, Lukas Berners, Jakub Holzer +1

Recent advances in scanning electron microscope (SEM) based Kikuchi diffraction have demonstrated the important potential for reflection and transmission methods, like transmission…