2 citations · 2 across the 2 of their papers we have counts for
4 papers · 1 filter
Cepstral Strain Mapping for Small Pixel-Count Detectors
Harikrishnan KP, Dasol Yoon, Yu-Tsun Shao +6
With the decreasing sizes of integrated-circuit components, the semiconductor industry is in growing need of high-throughput strain mapping techniques that offer high precision and…
Low barrier ZrO-based Josephson junctions
Jaehong Choi, Maciej Olszewski, Luojia Zhang +8
The Josephson junction is a crucial element in superconducting devices, and niobium is a promising candidate for the superconducting material due to its large energy gap relative t…
Mic-hackathon 2024: Hackathon on Machine Learning for Electron and Scanning Probe Microscopy
Utkarsh Pratiush, Austin Houston, Kamyar Barakati +70
Microscopy is a primary source of information on materials structure and functionality at nanometer and atomic scales. The data generated is often well-structured, enriched with me…
Emittance Minimization for Aberration Correction II: Physics-informed Bayesian Optimization of an Electron Microscope
Desheng Ma, Steven E. Zeltmann, Chenyu Zhang +6
Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an essential tool in understanding materials at the atomic scale. However, tuning the aberration co…