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cond-mat.mtrl-sci2025
Strong geometry dependence of the X-ray Thomson Scattering Spectrum in single crystal silicon
Thomas Gawne, Zhandos A. Moldabekov, Oliver S. Humphries +17
We report on results from an experiment at the European XFEL where we measured the x-ray Thomson scattering (XRTS) spectrum of single crystal silicon with ultrahigh resolution. Com…
cond-mat.mtrl-sci2024
X-ray induced grain boundary formation and grain rotation in Bi2Se3
Kento Katagiri, Bernard Kozioziemski, Eric Folsom +24
Optimizing grain boundary characteristics in polycrystalline materials can improve their properties. Many processing methods have been developed for grain boundary manipulation, in…