1 citations · 3 across the 8 of their papers we have counts for
9 papers
Detective quantum efficiency based comparison of HRTEM and ptychography phase imaging
Felix Bennemann, Angus I. Kirkland, David A. Muller +1
High-resolution transmission electron microscopy (HRTEM) is an important method for imaging beam sensitive materials often under cryo conditions. Electron ptychography in the scann…
Chromatic and Spherical Aberration Correction with Hexapole and Quadrupole Fields
Shigeyuki Morishita, Hidetaka Sawada, Norihiro Okoshi +4
We report the development of a chromatic and spherical aberration corrector based on combinations of hexapole and quadrupole fields. Thick hexapole fields are used to generate nega…
Fast Simulation of Damage Diffusion Distribution in Scanning Transmission Electron Microscopy
Amir Javadi Rad, Amirafshar Moshtaghpour, Dongdong Chen +1
Scanning Transmission Electron Microscopy (STEM) is a critical tool for imaging the properties of materials and biological specimens at atomic scale, yet our understanding of relev…
Electron Fourier ptychography for phase reconstruction
Jingjing Zhao, Chen Huang, Ali Mostaed +10
Phase reconstruction is important in transmission electron microscopy for structural studies. We describe electron Fourier ptychography and its application to phase reconstruction…
On Overlap Ratio in Defocused Electron Ptychography
Amirafshar Moshtaghpour, Angus I. Kirkland
Four-dimensional Scanning Transmission Electron Microscopy (4D STEM) with data acquired using a defocused electron probe is a promising tool for characterising complex biological s…
LoRePIE: Regularised Extended Ptychographical Iterative Engine for Low-dose and Fast Electron Ptychography
Amirafshar Moshtaghpour, Abner Velazco-Torrejon, Alex W. Robinson +2
The extended Ptychographical Iterative Engine (ePIE) is a widely used phase retrieval algorithm for Electron Ptychography from 4-dimensional (4-D) Scanning Transmission Electron Mi…
Compressive Electron Backscatter Diffraction Imaging
Zoë Broad, Alex W. Robinson, Jack Wells +4
Electron backscatter diffraction (EBSD) has developed over the last few decades into a valuable crystallographic characterisation method for a wide range of sample types. Despite t…
Diffusion Distribution Model for Damage Mitigation in Scanning Transmission Electron Microscopy
Amirafshar Moshtaghpour, Abner Velazco-Torrejon, Daniel Nicholls +3
Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some releva…
The Potential of Subsampling and Inpainting for Fast Low-Dose Cryo FIB-SEM Imaging and Tomography
Daniel Nicholls, Maryna Kobylysnka, Jack Wells +7
Traditional image acquisition for cryo focused ion-beam scanning electron microscopy tomography often sees thousands of images being captured over a period of many hours, with imme…