4 papers
Are Foundation Models Ready for Industrial Defect Recognition? A Reality Check on Real-World Data
Simon Baeuerle, Pratik Khanna, Nils Friederich +4
Foundation Models (FMs) have shown impressive performance on various text and image processing tasks. They can generalize across domains and datasets in a zero-shot setting. This c…
Rapid AI-based generation of coverage paths for dispensing applications
Simon Baeuerle, Ian F. Mendonca, Kristof Van Laerhoven +2
Coverage Path Planning of Thermal Interface Materials (TIM) plays a crucial role in the design of power electronics and electronic control units. Up to now, this is done manually b…
Coverage Path Planning for Thermal Interface Materials
Simon Baeuerle, Andreas Steimer, Ralf Mikut
Thermal management of power electronics and Electronic Control Units is crucial in times of increasing power densities and limited assembly space. Electric and autonomous vehicles…
Iterative Cluster Harvesting for Wafer Map Defect Patterns
Alina Pleli, Simon Baeuerle, Michel Janus +3
Unsupervised clustering of wafer map defect patterns is challenging because the appearance of certain defect patterns varies significantly. This includes changing shape, location,…