collaborators

1 paper

cond-mat.mtrl-sci2026

Compositional Metrology of Atom Probe Applied to non-Metallic Materials

Enrico Di Russo, François Vurpillot, Lorenzo Rigutti

Laser-assisted Atom Probe Tomography (LA-APT) has demonstrated a unique potential for the study of the 3D distribution of atomic species in semiconductor materials and devices, and…