14 citations · 15 across the 8 of their papers we have counts for
9 papers
Universal Drift Correction for Multidimensional Scanning Microscopy
Sangjoon Lee, William Millsaps, Dasol Yoon +7
In scanning microscopy, drift causes the specimen to be sampled at positions displaced from the nominal probe positions. This displacement alters the spatial assignment of the reco…
Scalable Bayesian Optimization of Composite Functions for Image-Based Inverse Problems in Materials Characterization
Dasol Yoon, Poompol Buathong, Chia-Hao Lee +3
Estimating physical parameters from scientific images is a common inverse problem in materials characterization that often relies on expensive physics-based simulations. In electro…
Three-dimensional imaging of oxygen dopant distribution in SrCuO by electron ptychography
Hongbin Yang, Jinkwon Kim, Desheng Ma +3
Oxygen dopants play a critical role in tuning the properties of cuprate superconductors, yet it is challenging to visualize them at the atomic scale. Here, we use multislice electr…
Visualizing Degradation in Anode-Free High-Utilization Aqueous Batteries Across Cell Lifetime
Sofia K. Catalina, Kyle Frohna, Willow Thompson +6
Operando microscopy has unveiled key mechanistic insights in battery materials during early cycling, but long-term characterization to unveil material evolution, degradation, and f…
Mind the Gap -- Imaging Buried Interfaces in Twisted Oxide Moirés
Harikrishnan KP, Xin Wei, Chia-Hao Lee +10
The ability to tune electronic structure in twisted stacks of two-dimensional (2D) materials has motivated the exploration of similar moiré physics with twisted oxide membranes. Du…
Cepstral Strain Mapping for Small Pixel-Count Detectors
Harikrishnan KP, Dasol Yoon, Yu-Tsun Shao +6
With the decreasing sizes of integrated-circuit components, the semiconductor industry is in growing need of high-throughput strain mapping techniques that offer high precision and…
Mic-hackathon 2024: Hackathon on Machine Learning for Electron and Scanning Probe Microscopy
Utkarsh Pratiush, Austin Houston, Kamyar Barakati +70
Microscopy is a primary source of information on materials structure and functionality at nanometer and atomic scales. The data generated is often well-structured, enriched with me…
PtyRAD: A High-performance and Flexible Ptychographic Reconstruction Framework with Automatic Differentiation
Chia-Hao Lee, Steven E. Zeltmann, Dasol Yoon +2
Electron ptychography has recently achieved unprecedented resolution, offering valuable insights across diverse material systems, including in three dimensions. However, high-quali…
Microscopic mechanisms of flexoelectricity in oxide membranes
Harikrishnan KP, Varun Harbola, Jaehong Choi +9
Modern electromechanical actuators and sensors rely on the piezoelectric effect that linearly couples strain and electric polarization. However, this effect is restricted to materi…