3 citations · 3 across the 3 of their papers we have counts for
Showing cs.CVShow all
2 papers · 1 filter
cs.CV2026
ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing
Wei Sun, Weixia Zhang, Linhan Cao +30
This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for Hi…
cs.CV2023★ 3 cited
Metric-aligned Sample Selection and Critical Feature Sampling for Oriented Object Detection
Peng Sun, Yongbin Zheng, Wenqi Wu +2
Arbitrary-oriented object detection is a relatively emerging but challenging task. Although remarkable progress has been made, there still remain many unsolved issues due to the la…