12 citations · 12 across the 3 of their papers we have counts for
3 papers
Unsupervised Anomaly Prediction with N-BEATS and Graph Neural Network in Multi-variate Semiconductor Process Time Series
Daniel Sorensen, Bappaditya Dey, Minjin Hwang +1
Semiconductor manufacturing is an extremely complex and precision-driven process, characterized by thousands of interdependent parameters collected across diverse tools and process…
Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series
Bappaditya Dey, Daniel Sorensen, Minjin Hwang +1
Semiconductor manufacturing is an extremely complex process, characterized by thousands of interdependent parameters collected across diverse tools and process steps. Multi-variate…
SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering
MinJin Hwang, Bappaditya Dey, Enrique Dehaerne +2
In this study, we applied the PointRend (Point-based Rendering) method to semiconductor defect segmentation. PointRend is an iterative segmentation algorithm inspired by image rend…