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physics.ins-det2025
Robust electron counting for direct electron detectors with the Back-Propagation Counting method
Joshua Renner, Matthew A. Wright, Kristofer Bouchard +6
Electron microscopy (EM) is a foundational tool for directly assessing the structure of materials. Recent advances in direct electron detectors have improved signal-to noise ratios…
physics.ins-det2023★ 35 cited
The 4D Camera: an 87 kHz direct electron detector for scanning/transmission electron microscopy
Peter Ercius, Ian J. Johnson, Philipp Pelz +19
We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 8…