Showing eess.IVShow all
2 papers · 1 filter
eess.IV2025
A Fourier-Based Global Denoising Model for Smart Artifacts Removing of Microscopy Images
Huanhuan Zhao, Connor Vernachio, Laxmi Bhurtel +9
Microscopy such as Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) are essential tools in material imaging at micro- and n…
eess.IV2025
A Bi-channel Aided Stitching of Atomic Force Microscopy Images
Huanhuan Zhao, Ruben Millan-Solsona, Marti Checa +4
Microscopy is an essential tool in scientific research, enabling the visualization of structures at micro- and nanoscale resolutions. However, the field of microscopy often encount…