activity
20242026
most citedVerilogReader: LLM-Aided Hardware Test Generation

30 citations · 31 across the 8 of their papers we have counts for

collaborators

9 papers

math.AP2026

pper and Lower Bounds for Blow-up Times in Coupled Reaction--Diffusion Systems with Nonlocal Sources

Xin Zhao, Aynuer Ailatusi, Xianfa Song +1

In this paper, we consider the following reaction-diffusion system \begin{equation*} \begin{cases} u_t=Δu+F\bigl(x,t,u,v,V(t)\bigr), & (x,t)\in\Om\times(0,T), v_t=Δv+G\bigl(x,t,u,v…

cs.DC2026

HiSparse: Scaling Sparse-Attention Decoding with Hierarchical KV Cache Management

Zhiqiang Xie, Zhangheng Huang, Tingwei Huang +3

Top-k sparse attention makes long-context LLM decoding cheap to compute: each step reads only a few thousand selected KV entries rather than the full context. Serving systems, howe…

cs.LG2026

HyperDFlash: Hyper-Connection-Aligned Block Speculative Decoding with Gated Residual Reduction

Luxi Lin, Shuang Peng, Rui Ma +7

We present HyperDFlash, a block-parallel speculative decoding framework tailored to DeepSeek-V4's Hyper-Connections (HC). Despite the strong performance of DeepSeek-V4's native Mul…

cs.DC2026

SAC: Disaggregated KV Cache System for Sparse Attention LLMs with CXL

Ruiyang Ma, Teng Ma, Junru Li +7

The scaling of LLMs toward long-context inference has shifted the primary serving system bottleneck from computation to memory capacity. Traditional solutions for dense attention m…

cs.AR2026

Pooling Engram Conditional Memory in Large Language Models using CXL

Ruiyang Ma, Teng Ma, Zhiyuan Su +11

Engram conditional memory has emerged as a promising component for LLMs by decoupling static knowledge lookup from dynamic computation. Since Engram exhibits sparse access patterns…

cs.LG2025

DynamicRTL: RTL Representation Learning for Dynamic Circuit Behavior

Ruiyang Ma, Yunhao Zhou, Yipeng Wang +9

There is a growing body of work on using Graph Neural Networks (GNNs) to learn representations of circuits, focusing primarily on their static characteristics. However, these model…

cs.AR2025

Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation

Ruiyang Ma, Daikang Kuang, Ziqian Liu +3

Debugging hardware designs requires significant manual effort during hardware development. After engineers identify a bug-triggering test case in simulation-based hardware verifica…

cs.CR2025★ 1 cited

Bridging the Gap between Hardware Fuzzing and Industrial Verification

Ruiyang Ma, Tianhao Wei, Jiaxi Zhang +3

As hardware design complexity increases, hardware fuzzing emerges as a promising tool for automating the verification process. However, a significant gap still exists before it can…

cs.SE2024★ 30 cited

VerilogReader: LLM-Aided Hardware Test Generation

Ruiyang Ma, Yuxin Yang, Ziqian Liu +4

Test generation has been a critical and labor-intensive process in hardware design verification. Recently, the emergence of Large Language Model (LLM) with their advanced understan…