2 citations · 3 across the 2 of their papers we have counts for
3 papers
STEM EBIC as a Quantitative Probe of Semiconductor Devices
Sebastian Schneider, Sebastian Beckert, René Hammer +3
Electron beam-induced current (EBIC) imaging in the scanning transmission electron microscope (STEM), STEM-EBIC, provides direct access to carrier transport at the nanoscale. While…
Noise Estimation and Suppression in Quantitative EMCD Measurements
Hitoshi Makino, Bernd Rellinghaus, Sebastian Schneider +2
Quantitative electron magnetic circular dichroism (EMCD) in transmission electron microscopy (TEM) enables the measurement of magnetic moments with elemental and atomic site sensit…
Direct identification of local doping effects in Barium-hexaferrite by electron vortex beams
Darius Pohl, Hitoshi Makino, Arthur Ernst +4
We demonstrate atomic-scale mapping of local magnetic moments and doping effects in Ti-doped barium hexaferrite (BaFe11TiO19) using atom-sized electron vortex beams (EVBs) with con…