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E. Tóth‐Kádár

1 paper here

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  • middle author1

Across the 1 of 1 paper where every author was matched, so the position is known.

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  • cond-mat.mtrl-sci1

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most citedReverse depth profiling of electrodeposited Co/Cu multilayers by SNMS

1 citations · 1 across the 1 of their papers we have counts for

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cond-mat.mtrl-sci2009★ 1 cited

Reverse depth profiling of electrodeposited Co/Cu multilayers by SNMS

A. Csik, K. Vad, G. A. Langer +3

The overall quality of multilayer thin films prepared by electrodeposition is strongly influenced by the surface and interface roughness which increases with the layer number. For…

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