Deep-Cryogenic Modeling of 22-nm FDSOI MOSFETs based on BSIM-IMG

Debargha Dutta, Kerim Ture, Fabio Olivieri +2

We present a modeling approach based on the BSIM-IMG compact model to capture the deep-cryogenic behavior of MOSFET devices in a 22-nm FDSOI technology. The modeling flow is based…