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cs.AR2025
InF-ATPG: Intelligent FFR-Driven ATPG with Advanced Circuit Representation Guided Reinforcement Learning
Bin Sun, Rengang Zhang, Zhiteng Chao +4
Automatic test pattern generation (ATPG) is a crucial process in integrated circuit (IC) design and testing, responsible for efficiently generating test patterns. As semiconductor…
cs.AR2025
RIROS: A Parallel RTL Fault SImulation FRamework with TwO-Dimensional Parallelism and Unified Schedule
Jiaping Tang, Jianan Mu, Zizhen Liu +6
With the rapid development of safety-critical applications such as autonomous driving and embodied intelligence, the functional safety of the corresponding electronic chips becomes…
cs.AR2025
Large Processor Chip Model
Kaiyan Chang, Mingzhi Chen, Yunji Chen +40
Computer System Architecture serves as a crucial bridge between software applications and the underlying hardware, encompassing components like compilers, CPUs, coprocessors, and R…