3 papers
cs.CV2026
AOI-SSL: Self-Supervised Framework for Efficient Segmentation of Wire-bonded Semiconductors In Optical Inspection
Joaquín Figueira, Rob Van Gastel, Giacomo D'Amicantonio +4
Segmentation models in automated optical inspection of wire-bonded semiconductors are typically device-specific and must be re-trained when new devices or distribution shifts appea…
cs.LG2025
Automated Discovery of Laser Dicing Processes with Bayesian Optimization for Semiconductor Manufacturing
David Leeftink, Roman Doll, Heleen Visserman +4
Laser dicing of semiconductor wafers is a critical step in microelectronic manufacturing, where multiple sequential laser passes precisely separate individual dies from the wafer.…
cs.CV2025
Decorrelation Speeds Up Vision Transformers
Kieran Carrigg, Rob van Gastel, Melda Yeghaian +3
Masked Autoencoder (MAE) pre-training of vision transformers (ViTs) yields strong performance in low-label data regimes but comes with substantial computational costs, making it im…