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cs.CR2026
SPARC: Automated Root-Cause Analysis of Pre-Silicon Power Side-Channel Leakage in the Processor Design Flow
Andrija Nešković, Christian Ewert, Mladen Berekovic +1
Power-Side-Channel Leakage (PSCL) originates from architectural and micro-architectural artifacts in a processor and poses a severe threat to the confidentiality of cryptographic s…
cs.CR2026
SAILOR: A Scalable and Energy-Efficient Ultra-Lightweight RISC-V for IoT Security
Christian Ewert, Tim Hardow, Melf Fritsch +5
Recently, RISC-V has contributed to the development of IoT devices, requiring architectures that balance energy efficiency, compact area, and integrated security. However, most rec…