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Absence of lateral domain wall mobility in Zn1-xMgxO thin films
Jack Eckstein, Kyle P. Kelley, William Prudnick +4
Polarization reversal in ferroelectrics arises from the coupled processes of domain nucleation and subsequent growth, yet the governing mechanisms differ fundamentally between clas…
Dynamics of Null and Electrostatic Blind Spots for Quantitative PFM
Marti Checa, Holland Swicegood, Ruben Millan-Solsona +5
Piezoresponse force microscopy is a cornerstone technique for probing nanoscale electromechanical phenomena, yet quantitative and in some cases qualitative interpretation remains h…
AEcroscopyWave: Towards Self-Driving Characterization Platforms for Agentic AI
Yongtao Liu, Jawad Chowdhury, Ganesh Narasimha +8
The characterization of electronic materials has traditionally been stratified into two distinct regimens: industry-scale automated systems to inspect materials for defects and ens…