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cond-mat.mtrl-sci2026
Dynamics of Null and Electrostatic Blind Spots for Quantitative PFM
Marti Checa, Holland Swicegood, Ruben Millan-Solsona +5
Piezoresponse force microscopy is a cornerstone technique for probing nanoscale electromechanical phenomena, yet quantitative and in some cases qualitative interpretation remains h…
cond-mat.mtrl-sci2026
AEcroscopyWave: Towards Self-Driving Characterization Platforms for Agentic AI
Yongtao Liu, Jawad Chowdhury, Ganesh Narasimha +8
The characterization of electronic materials has traditionally been stratified into two distinct regimens: industry-scale automated systems to inspect materials for defects and ens…
cond-mat.mtrl-sci2025
Auto-3DPFM: Automating Polarization-Vector Mapping at the Nanoscale
Ralph Bulanadi, Marti Checa, Michelle Wang +9
The functional properties of ferroelectric materials are strongly influenced by ferroelectric polarization orientation; as such, access to consistent and precise characterization o…